{"created":"2023-06-20T13:59:19.161676+00:00","id":5333,"links":{},"metadata":{"_buckets":{"deposit":"bcbfa0c6-1e7f-4e20-b70e-76754913b36a"},"_deposit":{"created_by":2,"id":"5333","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"5333"},"status":"published"},"_oai":{"id":"oai:hokkyodai.repo.nii.ac.jp:00005333","sets":["6:520"]},"author_link":["12267","12269","12266","12268"],"item_6_alternative_title_14":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"High Accuracy Analysis of Major and Trace Elements for Geological Samples using X-ray Fluorescence Spectrometry"}]},"item_6_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2003-09","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"59","bibliographicPageStart":"49","bibliographicVolumeNumber":"54","bibliographic_titles":[{"bibliographic_title":"北海道教育大学紀要. 自然科学編"}]}]},"item_6_description_17":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Departmental Bulletin Paper","subitem_description_type":"Other"}]},"item_6_full_name_2":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"12268","nameIdentifierScheme":"WEKO"}],"names":[{"name":"MIYAMOTO, Yoshihiko"}]},{"nameIdentifiers":[{"nameIdentifier":"12269","nameIdentifierScheme":"WEKO"}],"names":[{"name":"OKAMURA, Satoshi"}]}]},"item_6_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.32150/00005327","subitem_identifier_reg_type":"JaLC"}]},"item_6_publisher_15":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"北海道教育大学"}]},"item_6_rights_11":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"本文ファイルはNIIから提供されたものである。"}]},"item_6_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13442570","subitem_source_identifier_type":"ISSN"}]},"item_6_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11273226","subitem_source_identifier_type":"NCID"}]},"item_6_version_type_12":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"宮本, 佳彦"}],"nameIdentifiers":[{"nameIdentifier":"12266","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"岡村, 聡"}],"nameIdentifiers":[{"nameIdentifier":"12267","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-11-24"}],"displaytype":"detail","filename":"54-1-sizen-5.pdf","filesize":[{"value":"670.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"54-1-sizen-5.pdf","url":"https://hokkyodai.repo.nii.ac.jp/record/5333/files/54-1-sizen-5.pdf"},"version_id":"bcc46114-76e1-437f-8a1d-69ff4903ea6c"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"蛍光X線分析法による地質試料の主成分及び微量成分元素の高精度分析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"蛍光X線分析法による地質試料の主成分及び微量成分元素の高精度分析"}]},"item_type_id":"6","owner":"2","path":["520"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-05-21"},"publish_date":"2008-05-21","publish_status":"0","recid":"5333","relation_version_is_last":true,"title":["蛍光X線分析法による地質試料の主成分及び微量成分元素の高精度分析"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-06-20T17:10:42.890999+00:00"}